Applied Research & Photonics as Technology Leader in TeraSpectra® AFM Microscopy
by Roy Wright(Note: Roy Wright passed away on October 15, 2020. This writing was originally authored by Roy Wright, was posted on his own website, www.iims.us. Roy understood the importance of terahertz approach for camera-less imaging and spectroscopy. He tried to promote the technology in many forums. He will always be missed.)
From left: Anis Rahman, Roy Wright, and Senator Roger Wicker at the Graphene summit at the US Capitol. May 22, 2019.
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| From left: Anis Rahman, Roy Wright, and Senator Roger Wicker at the Graphene summit at the US Capitol. May 22, 2019. |
Main article by Roy Wright
Main article by Roy Wright
A United States grounded research and development manufacturer of TeraSpectra® AFM Spectrometer – Model TNS-3D-I Metrology Tool founded in 2003 by Anis Rahman, Ph.D.
Applied Research & Photonics, Inc, headquartered in Harrisburg, PA, is the technology leader and sole world-wide manufacturer of Terahertz ScanSource Beam Spectrometers, Nanoscanners and Reflectometers for materials and bioscience applications; dedicated to innovative instrumentation for nanoscience and nanotechnology.
A range of nanoscale structure and property measurement solutions comprise surface and interface imaging and analysis, particle sizing and distribution <1 nm resolution, lattice imaging and measurement, layer by layer analysis; volume (3D) imaging, terahertz spectral analysis, modeling and mapping – electrical properties, doping concentration, defect analysis, failure analysis, and metrology.
Novel benefit of TNS-3D-I Spectrometer Nanoscanning for Micro- Nano- and Lattice material test samples of all three axes utilize the integration of Dendrimer Dipole Excitation mechanism and Continuous Wave Terahertz Beam. This proprietary ScanSource Beam resolves the spatial limitation defined by “1873 ADL – Abbe Diffraction Limit” hence removing the need for an optical camera. Therefore, deeper learning-based image Nanoscanning offers peak measurement characteristics undetectable by UV, FTIR or Raman spectrometers; and displays higher sensitivity analysis for molecular events stemming from sub-Pico seconds time-domain Terahertz ScanSource Beam – 0.1 to ~30 THz.
TNS-3D-I Spectrometer is a 21st century patented metrology system concept evolving from the spatial limitation of camera-based spectrometer brands – Atomic Force Microscopy (AFM), Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM).
Key innovation of TeraSpectra® AFM Spectrometer for research and inspection scientists is the capability to scan Micro- Nano- and Lattice materials without contact or destruction of test samples in an ambient temperature environment; and to pinpoint and catalyze relevant deep surface examination and analysis of semiconductors, nanomaterials (OD-3D), Inorganics, Organics, Solids, Liquids and Gaseous samples remaining undisturbed (stationary) during Nanoscanning beam in the X- Y- Z- directions per user choice.
A United States grounded research and development manufacturer of TeraSpectra® AFM Spectrometer – Model TNS-3D-I Metrology Tool founded in 2003 by Anis Rahman, Ph.D.
Applied Research & Photonics, Inc, headquartered in Harrisburg, PA, is the technology leader and sole world-wide manufacturer of Terahertz ScanSource Beam Spectrometers, Nanoscanners and Reflectometers for materials and bioscience applications; dedicated to innovative instrumentation for nanoscience and nanotechnology.
A range of nanoscale structure and property measurement solutions comprise surface and interface imaging and analysis, particle sizing and distribution <1 nm resolution, lattice imaging and measurement, layer by layer analysis; volume (3D) imaging, terahertz spectral analysis, modeling and mapping – electrical properties, doping concentration, defect analysis, failure analysis, and metrology.
Novel benefit of TNS-3D-I Spectrometer Nanoscanning for Micro- Nano- and Lattice material test samples of all three axes utilize the integration of Dendrimer Dipole Excitation mechanism and Continuous Wave Terahertz Beam. This proprietary ScanSource Beam resolves the spatial limitation defined by “1873 ADL – Abbe Diffraction Limit” hence removing the need for an optical camera. Therefore, deeper learning-based image Nanoscanning offers peak measurement characteristics undetectable by UV, FTIR or Raman spectrometers; and displays higher sensitivity analysis for molecular events stemming from sub-Pico seconds time-domain Terahertz ScanSource Beam – 0.1 to ~30 THz.
TNS-3D-I Spectrometer is a 21st century patented metrology system concept evolving from the spatial limitation of camera-based spectrometer brands – Atomic Force Microscopy (AFM), Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM).
Key innovation of TeraSpectra® AFM Spectrometer for research and inspection scientists is the capability to scan Micro- Nano- and Lattice materials without contact or destruction of test samples in an ambient temperature environment; and to pinpoint and catalyze relevant deep surface examination and analysis of semiconductors, nanomaterials (OD-3D), Inorganics, Organics, Solids, Liquids and Gaseous samples remaining undisturbed (stationary) during Nanoscanning beam in the X- Y- Z- directions per user choice.
ARP Links to Technical Publications
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Effective testing for wafer rejects minimization by terahertz analysis and sub-surface imaging, ASMC 2014
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A to Z of a terahertz spectroscopy and sub-surface imaging experiment – September 2016
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Advances in Terahertz Spectroscopy Nanoscanner and Sub-surface 3D Imaging for Biomaterial Anis – September 2016
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Dendrimer based terahertz time-domain spectroscopy and applications in molecular characterization – July 2011
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Deformation kinetics of layered personal protective material under impact via terahertz reflectometry – April 2016
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Dendrimer Dipole Excitation: A New Mechanism for Terahertz Generation – Journal of Biosensors & Bioelectronics – 2016
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Terahertz Spectroscopic Analysis and Multispectral Imaging of Epitaxially Grown Semiconductors with Nanometer Resolution – Journal of Biosensor & Bioelectronics – 2016
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Investigation of high voltage induced damage of GaN grown on Si substrate by terahertz nano-imaging and spectroscopy. – Applied Research & Photonics, Inc. – May 18, 2017
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Interaction of Sensitizing Dyes with Nanostructured TiO2 Film in Dye-Sensitized Solar Cells Using Terahertz Spectroscopy – July 22, 2016 – Scientific Reports.
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Terahertz Sub-Nanometer Sub-Surface Imaging of 2D Materials – 2016 – Journal of Biosensors & Bioelectronics.
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Investigation of self-assembled monolayers on silicon wafer by terahertz spectrometry – Applied Research & Photonics, Inc.
For more information, please email: info@arphotonics.net
-
Effective testing for wafer rejects minimization by terahertz analysis and sub-surface imaging, ASMC 2014
-
A to Z of a terahertz spectroscopy and sub-surface imaging experiment – September 2016
-
Advances in Terahertz Spectroscopy Nanoscanner and Sub-surface 3D Imaging for Biomaterial Anis – September 2016
-
Dendrimer based terahertz time-domain spectroscopy and applications in molecular characterization – July 2011
-
Deformation kinetics of layered personal protective material under impact via terahertz reflectometry – April 2016
-
Dendrimer Dipole Excitation: A New Mechanism for Terahertz Generation – Journal of Biosensors & Bioelectronics – 2016
-
Terahertz Spectroscopic Analysis and Multispectral Imaging of Epitaxially Grown Semiconductors with Nanometer Resolution – Journal of Biosensor & Bioelectronics – 2016
-
Investigation of high voltage induced damage of GaN grown on Si substrate by terahertz nano-imaging and spectroscopy. – Applied Research & Photonics, Inc. – May 18, 2017
-
Interaction of Sensitizing Dyes with Nanostructured TiO2 Film in Dye-Sensitized Solar Cells Using Terahertz Spectroscopy – July 22, 2016 – Scientific Reports.
-
Terahertz Sub-Nanometer Sub-Surface Imaging of 2D Materials – 2016 – Journal of Biosensors & Bioelectronics.
-
Investigation of self-assembled monolayers on silicon wafer by terahertz spectrometry – Applied Research & Photonics, Inc.
For more information, please email: info@arphotonics.net
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